Interference from Thin Films — Question 8

Section 35-6 · Physics pages 5826–5827

Question 8 Changing the incident medium can reverse a film interference condition A film has nf = 1.40 and lies on a substrate with ns = 1.20. Initially its incident medium is air, n0 = 1.00. It is illuminated normally at λ0 = 560 nm and has thickness t = 100 nm. The incident medium is then replaced by a transparent liquid with index 1.60; the film and substrate are unchanged. n0 nf ns t n0 : 1.00 −→1.60 Schematic; labels, not drawing lengths, specify the data. (a) Classify the reflected phase condition before the liquid is added. (b) Repeat the phase analysis afterward and state whether the new minimum must have zero reflectance.
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Question 8 - Solution Changing the incident medium can reverse a film interference condition n0 nf ns t n0 : 1.00 −→1.60 (a) Method and calculation 2nft = 280 nm = λ0/2, ∆ϕprop = π. 1.00 < 1.40 > 1.20 : ∆ϕr = π =⇒δ = 2π : constructive . (b) Interpretation and further calculation 1.60 > 1.40 > 1.20 : ∆ϕr = 0 =⇒δ = π : destructive . Imin ∝|E1 −E2|2 =⇒a phase minimum need not be zero . Physical check The normal-incidence propagation phase inside the unchanged film is the same. The top-interface reflection sign is what changes.

Question 8

Changing the incident medium can reverse a film interference condition

A film has nf=1.40n_f=1.40 and lies on a substrate with ns=1.20n_s=1.20. Initially its incident medium is air, n0=1.00n_0=1.00. It is illuminated normally at λ0=560nm\lambda_0=560\,\mathrm{nm} and has thickness t=100nmt=100\,\mathrm{nm}. The incident medium is then replaced by a transparent liquid with index 1.60; the film and substrate are unchanged.

Diagram shown in the original SVG worksheet.

  1. Classify the reflected phase condition before the liquid is added.

  2. Repeat the phase analysis afterward and state whether the new minimum must have zero reflectance.

Question 8 - Solution

Changing the incident medium can reverse a film interference condition

Diagram shown in the original SVG worksheet.

(a) Method and calculation

2nft=280nm=λ0/2,Δϕprop=π.2n_ft=280\,\mathrm{nm}=\lambda_0/2,\quad\Delta\phi_{\mathrm{prop}}=\pi.1.00<1.40>1.20:Δϕr=π⇒δ=2π:constructive.1.00<1.40>1.20:\quad\Delta\phi_r=\pi\Longrightarrow\boxed{\delta=2\pi:\ \text{constructive}}.

(b) Interpretation and further calculation

1.60>1.40>1.20:Δϕr=0⇒δ=π:destructive.1.60>1.40>1.20:\quad\Delta\phi_r=0\Longrightarrow\boxed{\delta=\pi:\ \text{destructive}}.Imin∝|E1−E2|2⇒a phase minimum need not be zero.I_{\min}\propto|E_1-E_2|^2\Longrightarrow\boxed{\text{a phase minimum need not be zero}}.

Physical check

The normal-incidence propagation phase inside the unchanged film is the same. The top-interface reflection sign is what changes.